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DeCS
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Descriptor English:
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Microscopy, Scanning Probe
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Descriptor Spanish:
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Microscopía de Sonda de Barrido
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Descriptor Portuguese:
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Microscopia de Varredura por Sonda
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Synonyms English:
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Scanning Probe Microscopy
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Tree Number:
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E01.370.350.515.666
E05.595.666
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Definition English:
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Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING). |
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History Note English:
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2000; use MICROSCOPY, ATOMIC FORCE 1999
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Allowable Qualifiers English:
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Record Number:
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34522
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Unique Identifier:
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D020527
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Occurrence in VHL:
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Similar:
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DeCS
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